ReSun
Products
Functional Testing
Need to ensure your wafer or IC package meet performance specifications? We provide better service to you in all semiconductor testing to verify product function. With our advanced testing techniques and experienced team, we can detect defects and ensure that your products meet your expectations. Our services help you reduce production costs, increase yield, and improve product reliability. Trust us to provide you with the best Function Testing services on the market.
ReSun
WAT-Low Leakage testing
Wafer Testing- WAT Test
WAT probe card is applied to Wafer acceptance testing to test low leakage when wafer process.
ReSun
Cantilever Probe Probe Card
Wafer Testing- Cantilever
Cantilever probe card is widely used in logic wafer testing, it’s easy to design and manufacture, lower cost and short lead time to satisfy general specification.
ReSun
Vertical Probe Card
Wafer Testing- Vertical
Vertical probe card is mainly used for high-end SOC product testing, Vertical can be design for product with array design, high speed, high frequency function requirement.
ReSun
Functional Testing
Package Testing ( Load board, Socket )
Wafer Testing & Package Testing Load Board Plat
